Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging Ingestion-build-78747 hence to its mass (see

hence to its mass (see also 7

BS EN ISO 4126-2:2003 Safety devices for protection against excessive pressure

general information to the user

Annex A (normative) External thread – Calculation of stress area

Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging Ingestion-build-78747 hence to its mass (seeWhat is this standard about? This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly distributed pressure to the flexible substrate using the equipment.