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G03200 - SEMI G32 - カプセルなし熱抵抗測定用チップのガイドライン StdTpc-Photolithography Metrology this Test Method is suitable
G03200 - SEMI G32 - カプセルなし熱抵抗測定用チップのガイドライン StdTpc-Photolithography Metrology this Test Method is suitable
$180.00
Description
this Test Method is suitable for use only with 2 mm thick
1 The SEMI E49 Subordinate Standards are organized by types of piping distribution systems: gas
SEMI 3D20-0719 (first published)
1-1104 (technical revision)
G03200 - SEMI G32 - カプセルなし熱抵抗測定用チップのガイドライン StdTpc-Photolithography Metrology this Test Method is suitableglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1994 : 1 ! VLSI 3. 2 Referenced SEMI Standards None.
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