Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working Part No: KH3-710037

Part No: KH3-710037

Part No: 0020-79162

Removed from a JEOL JSM-6400F SEM Scanning Electron Microscope System This JEOL AP002261(00) Processor PCB is used working surplus

Inventory # AA-2974

Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working Part No: KH3-710037Nikon 300mm Wafer Inspection Stage Chuck NRM 3100 Overlay Measurement Working Model No: Inspection Stage Chuck Removed from a Nikon NRM 3100 300mm Wafer Overlay Measurement System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 25 lbs. Shipping Terms: All Domestic and